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common: add memtest.c with mem_test routine 

Add mem_test routine. Useful to detect timing problems if someone
porting a new device to barebox. This test includes a data bus test,
address bus test and integrity check of memory.

This mem_test routine has as parameter start and end address of testing
space. The last parameter can skip the integrity check.

Signed-off-by: Alexander Aring <alex.aring@gmail.com>
Signed-off-by: Sascha Hauer <s.hauer@pengutronix.de>
This commit is contained in:
Alexander Aring 2013-06-04 01:13:51 +02:00 committed by Sascha Hauer
parent 47f9da4380
commit 3275c7ea43
3 changed files with 328 additions and 0 deletions
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1
common/Makefile
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@ -18,6 +18,7 @@ obj-$(CONFIG_MALLOC_DLMALLOC) += dlmalloc.o
obj-$(CONFIG_MALLOC_TLSF) += tlsf_malloc.o
obj-$(CONFIG_MALLOC_TLSF) += tlsf.o
obj-$(CONFIG_MALLOC_DUMMY) += dummy_malloc.o
obj-$(CONFIG_CMD_MEMTEST) += memtest.o
obj-y += clock.o
obj-$(CONFIG_BANNER) += version.o
obj-$(CONFIG_MEMINFO) += meminfo.o

313
common/memtest.c Normal file
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@ -0,0 +1,313 @@
/*
* memory_test.c
*
* Copyright (c) 2013 Alexander Aring <aar@pengutronix.de>, Pengutronix
*
* (C) Copyright 2000
* Wolfgang Denk, DENX Software Engineering, wd@denx.de.
*
* See file CREDITS for list of people who contributed to this
* project.
*
* This program is free software; you can redistribute it and/or modify
* it under the terms of the GNU General Public License version 2
* as published by the Free Software Foundation.
*
* This program is distributed in the hope that it will be useful,
* but WITHOUT ANY WARRANTY; without even the implied warranty of
* MERCHANTABILITY or FITNESS FOR A PARTICULAR PURPOSE. See the
* GNU General Public License for more details.
*
*/
#include <progress.h>
#include <common.h>
#include <memory.h>
#include <types.h>
#include <sizes.h>
#include <memtest.h>
static const resource_size_t bitpattern[] = {
0x00000001, /* single bit */
0x00000003, /* two adjacent bits */
0x00000007, /* three adjacent bits */
0x0000000F, /* four adjacent bits */
0x00000005, /* two non-adjacent bits */
0x00000015, /* three non-adjacent bits */
0x00000055, /* four non-adjacent bits */
0xAAAAAAAA, /* alternating 1/0 */
};
/*
* Perform a memory test. The complete test
* loops until interrupted by ctrl-c.
*
* Prameters:
* start: start address for memory test.
* end: end address of memory test.
* bus_only: skip integrity check and do only a address/data bus
* testing.
*
* Return value can be -EINVAL for invalid parameter or -EINTR
* if memory test was interrupted.
*/
int mem_test(resource_size_t _start,
resource_size_t _end, int bus_only)
{
volatile resource_size_t *start, *dummy, val, readback, offset,
offset2, pattern, temp, anti_pattern, num_words;
int i;
_start = ALIGN(_start, sizeof(resource_size_t));
_end = ALIGN_DOWN(_end, sizeof(resource_size_t)) - 1;
if (_end <= _start)
return -EINVAL;
start = (resource_size_t *)_start;
/*
* Point the dummy to start[1]
*/
dummy = start + 1;
num_words = (_end - _start + 1)/sizeof(resource_size_t);
printf("Starting data line test.\n");
/*
* Data line test: write a pattern to the first
* location, write the 1's complement to a 'parking'
* address (changes the state of the data bus so a
* floating bus doen't give a false OK), and then
* read the value back. Note that we read it back
* into a variable because the next time we read it,
* it might be right (been there, tough to explain to
* the quality guys why it prints a failure when the
* "is" and "should be" are obviously the same in the
* error message).
*
* Rather than exhaustively testing, we test some
* patterns by shifting '1' bits through a field of
* '0's and '0' bits through a field of '1's (i.e.
* pattern and ~pattern).
*/
for (i = 0; i < ARRAY_SIZE(bitpattern)/
sizeof(resource_size_t); i++) {
val = bitpattern[i];
for (; val != 0; val <<= 1) {
*start = val;
/* clear the test data off of the bus */
*dummy = ~val;
readback = *start;
if (readback != val) {
printf("FAILURE (data line): "
"expected 0x%08x, actual 0x%08x at address 0x%08x.\n",
val, readback, (resource_size_t)start);
return -EIO;
}
*start = ~val;
*dummy = val;
readback = *start;
if (readback != ~val) {
printf("FAILURE (data line): "
"Is 0x%08x, should be 0x%08x at address 0x%08x.\n",
readback,
~val, (resource_size_t)start);
return -EIO;
}
}
}
/*
* Based on code whose Original Author and Copyright
* information follows: Copyright (c) 1998 by Michael
* Barr. This software is placed into the public
* domain and may be used for any purpose. However,
* this notice must not be changed or removed and no
* warranty is either expressed or implied by its
* publication or distribution.
*/
/*
* Address line test
*
* Description: Test the address bus wiring in a
* memory region by performing a walking
* 1's test on the relevant bits of the
* address and checking for aliasing.
* This test will find single-bit
* address failures such as stuck -high,
* stuck-low, and shorted pins. The base
* address and size of the region are
* selected by the caller.
*
* Notes: For best results, the selected base
* address should have enough LSB 0's to
* guarantee single address bit changes.
* For example, to test a 64-Kbyte
* region, select a base address on a
* 64-Kbyte boundary. Also, select the
* region size as a power-of-two if at
* all possible.
*
* ## NOTE ## Be sure to specify start and end
* addresses such that num_words has
* lots of bits set. For example an
* address range of 01000000 02000000 is
* bad while a range of 01000000
* 01ffffff is perfect.
*/
pattern = 0xAAAAAAAA;
anti_pattern = 0x55555555;
/*
* Write the default pattern at each of the
* power-of-two offsets.
*/
for (offset = 1; offset <= num_words; offset <<= 1)
start[offset] = pattern;
printf("Check for address bits stuck high.\n");
/*
* Check for address bits stuck high.
*/
for (offset = 1; offset <= num_words; offset <<= 1) {
temp = start[offset];
if (temp != pattern) {
printf("FAILURE: Address bit "
"stuck high @ 0x%08x:"
" expected 0x%08x, actual 0x%08x.\n",
(resource_size_t)&start[offset],
pattern, temp);
return -EIO;
}
}
printf("Check for address bits stuck "
"low or shorted.\n");
/*
* Check for address bits stuck low or shorted.
*/
for (offset2 = 1; offset2 <= num_words; offset2 <<= 1) {
start[offset2] = anti_pattern;
for (offset = 1; offset <= num_words; offset <<= 1) {
temp = start[offset];
if ((temp != pattern) &&
(offset != offset2)) {
printf("FAILURE: Address bit stuck"
" low or shorted @"
" 0x%08x: expected 0x%08x, actual 0x%08x.\n",
(resource_size_t)&start[offset],
pattern, temp);
return -EIO;
}
}
start[offset2] = pattern;
}
/*
* We tested only the bus if != 0
* leaving here
*/
if (bus_only)
return 0;
printf("Starting integrity check of physicaly ram.\n"
"Filling ram with patterns...\n");
/*
* Description: Test the integrity of a physical
* memory device by performing an
* increment/decrement test over the
* entire region. In the process every
* storage bit in the device is tested
* as a zero and a one. The base address
* and the size of the region are
* selected by the caller.
*/
/*
* Fill memory with a known pattern.
*/
init_progression_bar(num_words);
for (offset = 0; offset < num_words; offset++) {
/*
* Every 4K we update the progressbar.
*/
if (!(offset & (SZ_4K - 1))) {
if (ctrlc())
return -EINTR;
show_progress(offset);
}
start[offset] = offset + 1;
}
show_progress(offset);
printf("\nCompare written patterns...\n");
/*
* Check each location and invert it for the second pass.
*/
init_progression_bar(num_words - 1);
for (offset = 0; offset < num_words; offset++) {
if (!(offset & (SZ_4K - 1))) {
if (ctrlc())
return -EINTR;
show_progress(offset);
}
temp = start[offset];
if (temp != (offset + 1)) {
printf("\nFAILURE (read/write) @ 0x%08x:"
" expected 0x%08x, actual 0x%08x.\n",
(resource_size_t)&start[offset],
(offset + 1), temp);
return -EIO;
}
anti_pattern = ~(offset + 1);
start[offset] = anti_pattern;
}
show_progress(offset);
printf("\nFilling ram with inverted pattern and compare it...\n");
/*
* Check each location for the inverted pattern and zero it.
*/
init_progression_bar(num_words - 1);
for (offset = 0; offset < num_words; offset++) {
if (!(offset & (SZ_4K - 1))) {
if (ctrlc())
return -EINTR;
show_progress(offset);
}
anti_pattern = ~(offset + 1);
temp = start[offset];
if (temp != anti_pattern) {
printf("\nFAILURE (read/write): @ 0x%08x:"
" expected 0x%08x, actual 0x%08x.\n",
(resource_size_t)&start[offset],
anti_pattern, temp);
return -EIO;
}
start[offset] = 0;
}
show_progress(offset);
/*
* end of progressbar
*/
printf("\n");
return 0;
}

14
include/memtest.h Normal file
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@ -0,0 +1,14 @@
#ifndef __MEMTEST_H
#define __MEMTEST_H
#include <linux/ioport.h>
struct mem_test_resource {
struct resource *r;
struct list_head list;
};
int mem_test(resource_size_t _start,
resource_size_t _end, int bus_only);
#endif /* __MEMTEST_H */