Simon Glass ecc2ed55ee dm: i2c: Add tests for I2C ... Add some basic tests to check that the system works as expected. Signed-off-by: Simon Glass <sjg@chromium.org> Acked-by: Heiko Schocher <hs@denx.de>		2014-12-11 13:18:43 -07:00
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.gitignore	dm: Add basic tests	2014-03-04 12:15:29 -05:00
Makefile	dm: i2c: Add tests for I2C	2014-12-11 13:18:43 -07:00
bus.c	dm: core: Add functions for iterating through device children	2014-10-22 10:36:45 -06:00
cmd_dm.c	dm_test: improve the appearance shown by "dm tree" command	2014-12-11 13:18:41 -07:00
core.c	test: dm: Support memory leak checking as a core feature	2014-10-23 19:29:53 -06:00
gpio.c	test: dm: Add additional GPIO tests	2014-10-23 19:29:53 -06:00
i2c.c	dm: i2c: Add tests for I2C	2014-12-11 13:18:43 -07:00
sf.c	dm: sf: Add tests for SPI flash	2014-10-22 10:36:52 -06:00
spi.c	dm: spi: Add tests	2014-10-22 10:36:51 -06:00
test-dm.sh	dm: spi: Add tests	2014-10-22 10:36:51 -06:00
test-driver.c	dm: Allow drivers to be marked 'before relocation'	2014-07-23 14:07:24 +01:00
test-fdt.c	dm: Provide a function to scan child FDT nodes	2014-07-23 14:08:36 +01:00
test-main.c	test: dm: Support memory leak checking as a core feature	2014-10-23 19:29:53 -06:00
test-uclass.c	dm: rename device struct to udevice	2014-05-27 10:21:32 -04:00
test.dts	dm: i2c: Add tests for I2C	2014-12-11 13:18:43 -07:00
ut.c	dm: Add basic tests	2014-03-04 12:15:29 -05:00