2013-06-03 23:13:51 +00:00
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/*
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2014-04-10 12:04:06 +00:00
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* memtest.c
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2013-06-03 23:13:51 +00:00
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*
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2014-04-10 12:04:06 +00:00
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* Copyright (C) 2013 Alexander Aring <aar@pengutronix.de>, Pengutronix
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2013-06-03 23:13:51 +00:00
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*
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* (C) Copyright 2000
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* Wolfgang Denk, DENX Software Engineering, wd@denx.de.
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*
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* See file CREDITS for list of people who contributed to this
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* project.
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*
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* This program is free software; you can redistribute it and/or modify
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* it under the terms of the GNU General Public License version 2
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* as published by the Free Software Foundation.
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*
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* This program is distributed in the hope that it will be useful,
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* but WITHOUT ANY WARRANTY; without even the implied warranty of
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* MERCHANTABILITY or FITNESS FOR A PARTICULAR PURPOSE. See the
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* GNU General Public License for more details.
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*
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*/
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#include <progress.h>
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#include <common.h>
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#include <memory.h>
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#include <types.h>
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2015-01-08 07:02:20 +00:00
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#include <linux/sizes.h>
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2013-07-10 07:27:06 +00:00
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#include <errno.h>
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2013-06-03 23:13:51 +00:00
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#include <memtest.h>
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2015-05-14 02:54:21 +00:00
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static void mem_test_report_failure(const char *failure_description,
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resource_size_t expected_value,
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resource_size_t actual_value,
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volatile resource_size_t *address)
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{
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printf("FAILURE (%s): "
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"expected 0x%08x, actual 0x%08x at address 0x%08x.\n",
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failure_description, expected_value, actual_value,
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(resource_size_t)address);
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}
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2015-05-14 02:54:20 +00:00
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int mem_test_bus_integrity(resource_size_t _start,
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resource_size_t _end)
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2013-06-03 23:13:51 +00:00
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{
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2015-05-14 02:54:20 +00:00
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static const resource_size_t bitpattern[] = {
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0x00000001, /* single bit */
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0x00000003, /* two adjacent bits */
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0x00000007, /* three adjacent bits */
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0x0000000F, /* four adjacent bits */
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0x00000005, /* two non-adjacent bits */
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0x00000015, /* three non-adjacent bits */
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0x00000055, /* four non-adjacent bits */
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0xAAAAAAAA, /* alternating 1/0 */
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};
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volatile resource_size_t *start, *dummy, num_words, val, readback, offset,
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offset2, pattern, temp, anti_pattern;
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2013-06-03 23:13:51 +00:00
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int i;
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_start = ALIGN(_start, sizeof(resource_size_t));
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_end = ALIGN_DOWN(_end, sizeof(resource_size_t)) - 1;
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if (_end <= _start)
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return -EINVAL;
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start = (resource_size_t *)_start;
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2015-05-14 02:54:20 +00:00
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/*
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2013-06-03 23:13:51 +00:00
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* Point the dummy to start[1]
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*/
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dummy = start + 1;
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num_words = (_end - _start + 1)/sizeof(resource_size_t);
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printf("Starting data line test.\n");
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/*
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* Data line test: write a pattern to the first
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* location, write the 1's complement to a 'parking'
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* address (changes the state of the data bus so a
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* floating bus doen't give a false OK), and then
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* read the value back. Note that we read it back
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* into a variable because the next time we read it,
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* it might be right (been there, tough to explain to
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* the quality guys why it prints a failure when the
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* "is" and "should be" are obviously the same in the
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* error message).
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*
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* Rather than exhaustively testing, we test some
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* patterns by shifting '1' bits through a field of
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* '0's and '0' bits through a field of '1's (i.e.
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* pattern and ~pattern).
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*/
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2015-05-14 02:54:18 +00:00
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for (i = 0; i < ARRAY_SIZE(bitpattern); i++) {
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2013-06-03 23:13:51 +00:00
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val = bitpattern[i];
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for (; val != 0; val <<= 1) {
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*start = val;
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/* clear the test data off of the bus */
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*dummy = ~val;
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readback = *start;
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if (readback != val) {
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2015-05-14 02:54:21 +00:00
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mem_test_report_failure("data line",
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val, readback, start);
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2013-06-03 23:13:51 +00:00
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return -EIO;
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}
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*start = ~val;
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*dummy = val;
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readback = *start;
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if (readback != ~val) {
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2015-05-14 02:54:21 +00:00
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mem_test_report_failure("data line",
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~val, readback, start);
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2013-06-03 23:13:51 +00:00
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return -EIO;
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}
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}
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}
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/*
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* Based on code whose Original Author and Copyright
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* information follows: Copyright (c) 1998 by Michael
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* Barr. This software is placed into the public
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* domain and may be used for any purpose. However,
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* this notice must not be changed or removed and no
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* warranty is either expressed or implied by its
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* publication or distribution.
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*/
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/*
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* Address line test
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*
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* Description: Test the address bus wiring in a
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* memory region by performing a walking
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* 1's test on the relevant bits of the
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* address and checking for aliasing.
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* This test will find single-bit
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* address failures such as stuck -high,
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* stuck-low, and shorted pins. The base
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* address and size of the region are
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* selected by the caller.
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*
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* Notes: For best results, the selected base
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* address should have enough LSB 0's to
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* guarantee single address bit changes.
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* For example, to test a 64-Kbyte
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* region, select a base address on a
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* 64-Kbyte boundary. Also, select the
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* region size as a power-of-two if at
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* all possible.
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*
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* ## NOTE ## Be sure to specify start and end
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* addresses such that num_words has
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* lots of bits set. For example an
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* address range of 01000000 02000000 is
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* bad while a range of 01000000
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* 01ffffff is perfect.
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*/
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pattern = 0xAAAAAAAA;
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anti_pattern = 0x55555555;
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/*
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* Write the default pattern at each of the
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* power-of-two offsets.
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*/
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for (offset = 1; offset <= num_words; offset <<= 1)
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start[offset] = pattern;
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2015-05-14 02:54:19 +00:00
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/*
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* Now write anti-pattern at offset 0. If during the previous
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* step one of the address lines got stuck high this
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* operation would result in a memory cell at power-of-two
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* offset being set to anti-pattern which hopefully would be
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* detected byt the loop that follows.
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*/
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start[0] = anti_pattern;
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2013-06-03 23:13:51 +00:00
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printf("Check for address bits stuck high.\n");
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/*
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* Check for address bits stuck high.
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*/
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for (offset = 1; offset <= num_words; offset <<= 1) {
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temp = start[offset];
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if (temp != pattern) {
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2015-05-14 02:54:21 +00:00
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mem_test_report_failure("address bit stuck high",
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pattern, temp, &start[offset]);
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2013-06-03 23:13:51 +00:00
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return -EIO;
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}
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}
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2015-05-14 02:54:19 +00:00
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/*
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Restore original value
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*/
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start[0] = pattern;
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2013-06-03 23:13:51 +00:00
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printf("Check for address bits stuck "
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"low or shorted.\n");
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/*
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* Check for address bits stuck low or shorted.
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*/
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for (offset2 = 1; offset2 <= num_words; offset2 <<= 1) {
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start[offset2] = anti_pattern;
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2015-05-14 02:54:19 +00:00
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for (offset = 0; offset <= num_words;
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offset = (offset) ? offset << 1 : 1) {
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2013-06-03 23:13:51 +00:00
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temp = start[offset];
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if ((temp != pattern) &&
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(offset != offset2)) {
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2015-05-14 02:54:21 +00:00
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mem_test_report_failure(
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"address bit stuck low or shorted",
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pattern, temp, &start[offset]);
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2013-06-03 23:13:51 +00:00
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return -EIO;
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}
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}
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start[offset2] = pattern;
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}
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2015-05-14 02:54:20 +00:00
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return 0;
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}
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int mem_test_dram(resource_size_t _start,
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resource_size_t _end)
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{
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volatile resource_size_t *start, num_words, offset, temp, anti_pattern;
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_start = ALIGN(_start, sizeof(resource_size_t));
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_end = ALIGN_DOWN(_end, sizeof(resource_size_t)) - 1;
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if (_end <= _start)
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return -EINVAL;
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start = (resource_size_t *)_start;
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num_words = (_end - _start + 1)/sizeof(resource_size_t);
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2013-06-03 23:13:51 +00:00
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printf("Starting integrity check of physicaly ram.\n"
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2015-05-14 02:54:20 +00:00
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"Filling ram with patterns...\n");
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2013-06-03 23:13:51 +00:00
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/*
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* Description: Test the integrity of a physical
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* memory device by performing an
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* increment/decrement test over the
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* entire region. In the process every
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* storage bit in the device is tested
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* as a zero and a one. The base address
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* and the size of the region are
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* selected by the caller.
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*/
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/*
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* Fill memory with a known pattern.
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*/
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init_progression_bar(num_words);
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2015-05-14 02:54:20 +00:00
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2013-06-03 23:13:51 +00:00
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for (offset = 0; offset < num_words; offset++) {
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/*
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* Every 4K we update the progressbar.
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*/
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2015-05-14 02:54:20 +00:00
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2013-06-03 23:13:51 +00:00
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if (!(offset & (SZ_4K - 1))) {
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if (ctrlc())
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return -EINTR;
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show_progress(offset);
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}
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start[offset] = offset + 1;
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}
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show_progress(offset);
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printf("\nCompare written patterns...\n");
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/*
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* Check each location and invert it for the second pass.
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*/
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init_progression_bar(num_words - 1);
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for (offset = 0; offset < num_words; offset++) {
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if (!(offset & (SZ_4K - 1))) {
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if (ctrlc())
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return -EINTR;
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show_progress(offset);
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}
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temp = start[offset];
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if (temp != (offset + 1)) {
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2015-05-14 02:54:21 +00:00
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printf("\n");
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mem_test_report_failure("read/write",
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(offset + 1),
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temp, &start[offset]);
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2013-06-03 23:13:51 +00:00
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return -EIO;
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}
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anti_pattern = ~(offset + 1);
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start[offset] = anti_pattern;
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}
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show_progress(offset);
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printf("\nFilling ram with inverted pattern and compare it...\n");
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/*
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* Check each location for the inverted pattern and zero it.
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*/
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init_progression_bar(num_words - 1);
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for (offset = 0; offset < num_words; offset++) {
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if (!(offset & (SZ_4K - 1))) {
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if (ctrlc())
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return -EINTR;
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show_progress(offset);
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}
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anti_pattern = ~(offset + 1);
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temp = start[offset];
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if (temp != anti_pattern) {
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2015-05-14 02:54:21 +00:00
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printf("\n");
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mem_test_report_failure("read/write",
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anti_pattern,
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temp, &start[offset]);
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2013-06-03 23:13:51 +00:00
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return -EIO;
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}
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start[offset] = 0;
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}
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show_progress(offset);
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/*
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* end of progressbar
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*/
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printf("\n");
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return 0;
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}
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2015-05-14 02:54:20 +00:00
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/*
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* Perform a memory test. The complete test
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* loops until interrupted by ctrl-c.
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*
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* Prameters:
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* start: start address for memory test.
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* end: end address of memory test.
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* bus_only: skip integrity check and do only a address/data bus
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* testing.
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*
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* Return value can be -EINVAL for invalid parameter or -EINTR
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* if memory test was interrupted.
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*/
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int mem_test(resource_size_t _start,
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resource_size_t _end, int bus_only)
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{
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int ret;
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ret = mem_test_bus_integrity(_start, _end);
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if (ret < 0)
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return ret;
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/*
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* We tested only the bus if != 0
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* leaving here
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*/
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if (!bus_only)
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ret = mem_test_dram(_start, _end);
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return ret;
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}
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